The Wafer Excursions And Impact On Semiconductor Yield
DALL-E Yield And Wafer Excursions: In the complex world of semiconductor manufacturing, maintaining a high yield – the percentage of functional devices from a batch of wafers – is the ultimate goal. However, various challenges, including wafer excursions, can impede this process. These wafer-level deviations from the standard processing environment often impact yield by introducing defects that affect the final product’s performance and reliability. Thus, in addition to several yield-related learnings, it is also crucial to understand wafer excursions and how they correlate to introducing new semiconductor products. Premier On Wafer Excursions: Wafer excursions refer to any anomalies that occur during the semiconductor manufacturing process, deviating from the controlled conditions expected in production. These can range from several fluctuations in material, mask, fabrication step, equipment, etc. The consequences of these excursions can […]
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