Nano Banana Fragmented Data To Integrated Manufacturing Intelligence Semiconductor manufacturing has always been data-intensive, but historically this data has been fragmented across multiple systems, including equipment logs, yield databases, test data, MES, and enterprise systems. These systems evolved independently and were optimized for specific functions rather than unified decision-making. At the core of the factory, Manufacturing Execution Systems (MES) track and control production in real time, serving as the bridge between planning systems and physical operations. These platforms monitor workflows, enforce process routes, and maintain traceability across wafers and lots. However, MES alone does not solve the broader challenge. Semiconductor manufacturing needs integration across design data, process data, equipment signals, and test outcomes. Modern fabs now generate vast, varied datasets that must be connected, contextualized, and analyzed […]