Published On: December 27, 2025

Nano Banana What Is Silicon Test Analytics Silicon test analytics refers to the systematic analysis of data generated during semiconductor testing to improve yield, product quality, and manufacturing efficiency. It operates across wafer sort, final test, and system-level test, using test results to understand how silicon behaves under electrical, thermal, and functional stress. At a practical level, test analytics converts raw tester outputs into engineering insight. This includes identifying yield loss mechanisms, detecting parametric shifts, correlating failures across test steps, and validating the effectiveness of test coverage. The objective is not only to detect failing devices, but to understand why they fail and how test outcomes evolve across lots, wafers, and time. Unlike design-time analysis, silicon test analytics is closely tied to manufacturing reality. Data is generated […]